Discover initial defects of your battery by checking for a voltage drop during aging testing. A voltage drop test can be easily applied in your production line, as opposed to often used complex systems that would also involve down-times for maintenance or additional calibration.
When a battery has a defect such as a minute short-circuit, self-discharging causes the battery voltage to fall. Such defects can be discovered with short aging times using a high-precision, high-resolution voltmeter that allows to detect even slight voltage drops.
Defective battery cells with large self-discharge are identified by an aging process. If a slight drop in voltage is captured, it is possible to rapidly detect a defective cell.
For tests like voltage drop tests for batteries where miniscule voltage changes are monitored over a long period of time to make a pass/fail judgment, the accuracy and long-term stability of the measuring instrument are essential.
The combination of the DM7276 with the multi scanner SW1002 and its free software is ideal for voltage drop tests of large numbers of battery cells in the aging process. This realizes the set up a 264-cell test-system. Various functions allow you to measure initial voltage, voltage drops and voltage drop rates (e.g. mV/day, mV/hour). The included judgment function makes it easy to determine which battery cell is experiencing aging defects.
HIOKI precision DC voltmeter DM7276
Switch Mainframe SW1002
| DC Voltage | 100 mV ( ±120.000 00 mV) to 1000 V ( ±1000.000 0 V ), 5 ranges |
| Basic accuracy | 10 V range: ±0.0009% rdg. ±12 μV |
| Temperature | -10.0°C to 60.0°C, combined with sensor Z2001: ±0.7°C (-10°C to 50°C) |
| Measurement support functions | Temperature compensation, Contact check, Comparator, BIN, Absolute value judgment, etc. |
| Power supply | 100 to 240 V AC, 50/60 Hz, 30 VA |
| Interfaces | Standard: LAN (100BASE-TX), EXT. I/O, USB flash drive / USB device (USB2.0 Full-Speed). Optional: GP-IB (-02 type only) / RS-232C (-03 type only) / PRINTER (-03 type only) |
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